Subjects Particle size determination — Methodology — Standards. This part of ISO is applicable to particle iwo ranging from approximately 0,1 um to 3mm. Specification NanoTec Typical measuring time 10 s Minimum time between measurements 2 min. These online bookshops told us they have this item: Login to add to list.
Check copyright status Cite this Title Particle size analysis — laser diffraction methods. Part 1, General principles.
We were unable to find this edition in any bookshop we are able to search. Add a tag Cancel Be the first to add a tag for this edition.
This single location in All: Lower detection limit for small amounts of small and large particles in size distributions with measuring range. This website uses cookies to improve your experience while you navigate through the website.
Part 1. This part of ISO provides guidance on the measurement of size distributions of particles in any two-phase system, for example powders, sprays. Industriestrasse 8 Idar-Oberstein. Lists What are lists? Login to add to list. Indicative description of mathematical methods for example weighting, bounding, grading. Check copyright status Cite this Title Particle size analysis — laser diffraction methods. Physical Description v, 34 p. Subjects Particle size determination — Methodology — Standards.
Laser beams — Diffraction — Standards. It does not address the specific requirements of particle size measurement of specific products. This part of ISO is applicable to particle sizes ranging from approximately 0,1 um to 3mm.
For non-spherical particles, and equivalent-sphere size distribtution is obtained because the technique uses the assumption of spherical particles in its optical model.
The resulting particle size distribution may be different from those obtained by methods based on other physical principles e. This single location in All: Open to the public iiso This single location in Victoria: None of your libraries hold this item.
Physical Description v, 34 p. To include a comma in your tag, surround the tag with double quotes. Subjects Particle size determination — Methodology — Standards.
Specification NanoTec Number of elements 51 Geometry e. Specification NanoTec Measuring range, overall and during each analysis 0. Login to add to list. The resulting particle size distribution may be different from those obtained by methods based on other physical principles e. It does not address the specific requirements of particle size measurement of specific products.
Skip to content Skip to search. Add a tag Cancel Be the first to add a tag for this edition. Public Private login e. Physical Description v, 34 p. Login to add to list. Add a tag Cancel Be the first to add a tag for this edition. Segments Alignment automatic oder manual automatic and manual Detector elements calibrated yes Lower detection limit for small amounts and of small and large particles yes Overload level for detector elements 12Bit, Be the first to add this to a list. All laser diffraction instruments for particle size measurement can be compared worldwide based on this table.
Lower detection limit for small amounts of small and large particles in size distributions with measuring range. Subcommittee SC 4, Sizing by methods other than sieving.
Specification NanoTec Typical measuring time 10 s Minimum time between measurements 2 min. Specification NanoTec Calculation of model matrix yes Multiple scattering calculation yes, internal Type of optical models that can be applied Mie, Fraunhofer Indicative description of mathematical methods for example weighting, bounding, grading Regularization.
Separate different tags with a comma.
0コメント